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dc.contributor.authorWright, Nicholas Georgeen
dc.date.accessioned2015-11-04T16:11:28Z
dc.date.available2015-11-04T16:11:28Z
dc.date.issued1994en
dc.identifier.urihttp://hdl.handle.net/1842/11608
dc.description.abstracten
dc.publisherThe University of Edinburghen
dc.subjectKB thesis scanning project 2015en
dc.titlePreferred orientation modelling in high-pressure powder diffraction applied to structural studies of semiconductorsen
dc.typeThesis or Dissertationen
dc.type.qualificationlevelDoctoralen
dc.type.qualificationnamePhD Doctor of Philosophyen


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